MK Teknology1 Private Limited
MK Teknology1 Private Limited
New Delhi, Delhi
GST No. 07AAFCM2477F1ZG
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InProcess Nanoparticle Size Analyzer

A New Innovative Technology for Continuous Real-time In-process Nanoparticle Size Characterization from Inprocess LSP for quantification of nanoparticles, liposomes, nanosuspensions, nanoemulsions etc. in pharmaceutical industry or research applications.

Spatially-Resolved Dynamic Light Scattering (SR-DLS)

Spatially-Resolved Dynamic Light Scattering (SR-DLS)
  • Spatially-Resolved Dynamic Light Scattering (SR-DLS)
  • Spatially-Resolved Dynamic Light Scattering (SR-DLS)
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Product Details:

Usage/ApplicationProduct development, R&D, quality inspection of nanosuspensions, nanoemulsions etc.
BrandInProcess LSP
FeaturesContinuous size characterization during processing,real-time process feedback & high speed detection
Particle Size Range10 - 1000 nm
DetectionBack-scattering (180 Degree)
Central Wavelength1300 nm
Maximum Process Flow6 L/min for polystyrene particles (100 nm,5 mg/mL)
Particle Size DistributionIntensity based and volume based,d10 / d50 / d90

The NanoFlowSizer is a new innovative system for continuous, real-time nanoparticle size characterization and a powerful non-invasive Process Analytical Tool allowing close monitoring of particle size characteristics in your process in either development laboratories, pilot plants or commercial operations, without the need of sampling.

 

Standard DLS measurements need to be performed under static conditions ensuring that particle movement is solely caused by Brownian motion and not influenced by other factors like liquid flow. Additionally, standard DLS cannot be applied to the turbid suspension which are often encountered in industrial or process environments.

 

These limitations can be overcome by the new concept of Spatially Resolved Dynamic Light Scattering (SR-DLS) which allows particle size characterization in process flows and for highly turbid suspensions. The NanoFlowSizer technology is based on low coherence interferometry providing light scattering information as function of optical path-length in process flows. The depth resolved light scattering holds information on particle movement caused by both Brownian motion as well as flow rate. The contribution to scattered light fluctuations due to Brownian motion is used for calculation of the particle size characteristics.

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Sanjay Miglani (Director)
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